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A new characterization method for few‐moded optical fibers
Author(s) -
Hosain S. I.,
Meunier J. P.
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650051011
Subject(s) - characterization (materials science) , optical fiber , cutoff , fiber , simple (philosophy) , wavelength , optics , cutoff frequency , computer science , materials science , physics , composite material , philosophy , epistemology , quantum mechanics
A new simple method of characterization has been proposed for a few‐moded optical fiber from the knowledge of the cutoff wavelengths of the first few modes. The method gives firsthand information about the various parameters of interest of the fiber. © 1992 John Wiley & Sons. Inc.