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Design parameters of asymmetric edge‐coupled microstrip open‐end discontinuities
Author(s) -
Martel J.,
Boix R. R.,
Horno M.
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650050905
Subject(s) - strips , discontinuity (linguistics) , classification of discontinuities , microstrip , capacitance , enhanced data rates for gsm evolution , anisotropy , galerkin method , materials science , equivalent circuit , physics , electronic engineering , electrical engineering , mathematical analysis , mathematics , engineering , structural engineering , optics , telecommunications , voltage , composite material , finite element method , electrode , quantum mechanics
A lumped capacitance equivalent circuit is used to characterize the asymmetric edge‐coupled microstrip discontinuity in the case in which the conducting strips are embedded in a multilayered anisotropic medium. The Galerkin method in the spectral domain is employed to determine the excess charge density on the strips of the discontinuity. Original results are provided for the general asymmetric discontinuity in conventional and suspended configurations. © 1992 John Wiley & Sons, Inc.