A study of optically controlled millimeter‐wave propagation characteristics in a metallic rectangular waveguide loaded with double dielectric layers | Zendy

Zhiyuan Yu | Zendy; Welgan Lin | Zendy

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A study of optically controlled millimeter‐wave propagation characteristics in a metallic rectangular waveguide loaded with double dielectric layers

Author(s) -

Zhiyuan Yu,

Welgan Lin

Publication year - 1992

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650050417

Subject(s) - materials science , dielectric , waveguide , optics , optoelectronics , attenuation , homogeneous , extremely high frequency , optically active , metal , sensitivity (control systems) , physics , electronic engineering , chemistry , organic chemistry , metallurgy , thermodynamics , engineering

This article presents the theoretical analysis of a new optically controlled metallic waveguide structure loaded with double dielectric layers in H face. This structure shows higher optical sensitivity than that loaded with a homogeneous semiconductor dielectric layer. It can give an optically controlled phase shift greater than 4000 deg/cm and an optically controlled attenuation of more than 200 dB/cm.

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