Premium
A study of optically controlled millimeter‐wave propagation characteristics in a metallic rectangular waveguide loaded with double dielectric layers
Author(s) -
Zhiyuan Yu,
Welgan Lin
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650050417
Subject(s) - materials science , dielectric , waveguide , optics , optoelectronics , attenuation , homogeneous , extremely high frequency , optically active , metal , sensitivity (control systems) , physics , electronic engineering , chemistry , organic chemistry , metallurgy , thermodynamics , engineering
This article presents the theoretical analysis of a new optically controlled metallic waveguide structure loaded with double dielectric layers in H face. This structure shows higher optical sensitivity than that loaded with a homogeneous semiconductor dielectric layer. It can give an optically controlled phase shift greater than 4000 deg/cm and an optically controlled attenuation of more than 200 dB/cm.