Premium
Refractive index control on the polarization sensitivities of semiconductor traveling‐wave laser amplifiers
Author(s) -
Ghafouri Shiraz H.,
Chu C. Y. J.
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650050317
Subject(s) - polarization (electrochemistry) , optics , refractive index , materials science , amplifier , laser , transverse plane , semiconductor laser theory , optoelectronics , semiconductor , optical amplifier , physics , engineering , chemistry , structural engineering , cmos
We have found that the polarization sensitivity of buried heterostructure traveling‐wave laser amplifiers can be minimized further by controlling the refractive index profile in its transverse plane, in addition to increasing the active layer thickness.