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Accuracy of swept‐frequency measurement of optical modulator frequency response
Author(s) -
Zhu Ning Hua,
Zheng Xing Shi,
Lin Yi Kun
Publication year - 1991
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650040905
Subject(s) - distortion (music) , frequency modulation , optics , frequency response , physics , electro optic modulator , modulation (music) , voltage , frequency deviation , square wave , acoustics , optical modulator , electronic engineering , phase modulation , computer science , electrical engineering , automatic frequency control , radio frequency , engineering , telecommunications , optoelectronics , amplifier , cmos , quantum mechanics , phase noise
Formulas explaining the principle of the swept‐frequency technique of measuring modulation depth have been derived for square‐wave distortion. Further investigation shows that when the drive voltage is smaller than 1/3 V /pi the measurement is sufficiently accurate for practical application.