Premium
Dielectric properties measurement of substrate and support materials
Author(s) -
Wu TeKao
Publication year - 1990
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650030805
Subject(s) - dissipation factor , dielectric , materials science , ceramic , composite material , dielectric loss , substrate (aquarium) , tangent , waveguide , electronic engineering , optoelectronics , geometry , mathematics , engineering , oceanography , geology
In this paper a fast and straightforward waveguide measurement technique is described for the determination of the dielectric constant and loss tangent of many commercially available materials. These dielectric materials include Cuflon, Teflon, Arlon's polyimides, Lockheed's ceramic foams, and Rogers Duroid materials. The effective dielectric constant and loss tangent of Hexsel's honeycomb material is also measured by this method and is compared to the predicted data obtained using the volume averaging theory. The accuracy and other features of this measurement technique are also discussed.