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Analysis of microstrip‐like transmission lines with finite metallization thickness
Author(s) -
Tan ChungHsing,
Chang TheNan
Publication year - 1990
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650030712
Subject(s) - microstrip , shielded cable , galerkin method , materials science , aperture (computer memory) , electric power transmission , transverse plane , dispersion (optics) , transmission line , finite element method , acoustics , optics , electronic engineering , physics , engineering , electrical engineering , structural engineering
The transverse modal analysis (TMA) method is used for deriving the dispersion characteristics of microstrip‐like transmission lines with finite metallization thickness. Instead of using strip currents as source quantities, the aperture fields are employed for applying the Galerkin method. Numerical results show that the metallization thickness will decrease the propagation constant of both shielded microstrips and suspended strip lines. To verify the accuracy of the present method, the results are also compared with those obtained by other methods.