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Measurements of signal transmission to 20 GHz and crosstalk to 10 GHz on small copper microstrips embedded in polyimide dielectric
Author(s) -
Loos J. S.,
Engvik A. H.,
Lin M. S.,
LinHendel C. G.
Publication year - 1990
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650030702
Subject(s) - polyimide , materials science , resistive touchscreen , crosstalk , transmission line , optoelectronics , copper , dielectric , microstrip , optics , electrical engineering , composite material , physics , engineering , layer (electronics) , metallurgy
Multi‐GHz measurements of signal propagation and crosstalk are reported for small, somewhat resistive, copper microstrips (20‐30 μm width and 2‐3 μm thickness) that are embedded in polyimide dielectric and fabricated on a silicon substrate. The transmission, reflection, signal velocity, and crosstalk on 50‐Ω terminated microstrips are well behaved and, moreover, are well described by standard transmission line theory when resistive losses (corrected for the skin effect) are included.