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Calculations on the increased sensitivity of dielectric constant measurements using open‐end coaxial line with a hemispherical center conductor extension
Author(s) -
Xu Yansheng,
Bosisio Renato G.
Publication year - 1990
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650030210
Subject(s) - conductor , dielectric , coaxial , sensitivity (control systems) , materials science , line (geometry) , optics , electrical conductor , constant (computer programming) , center (category theory) , acoustics , electrical engineering , optoelectronics , electronic engineering , physics , engineering , geometry , composite material , chemistry , computer science , mathematics , programming language , crystallography
In this paper, the method of measurement of dielectric constant by using open‐ended coaxial lines with a hemispherical center conductor extension is examined in great detail. Calculation results show that this method can considerably improve the sensitivity of measurement while retaining the advantages of a simple mechanical construction. Such a probe is conveniently used with any material that can intimately embrace the hemispherical tip of the probe (e.g., liquids, fine powders, etc.).