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Scanning tunneling microscopy of thin film surfaces and film steps
Author(s) -
Yue Lin,
Xiangzhen Chen,
Runwen Wang
Publication year - 1989
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650020407
Subject(s) - scanning tunneling microscope , stylus , materials science , electrochemical scanning tunneling microscope , scanning probe microscopy , microscopy , optical microscope , quantum tunnelling , microscope , spin polarized scanning tunneling microscopy , thin film , optics , scanning tunneling spectroscopy , scanning ion conductance microscopy , nanotechnology , optoelectronics , scanning electron microscope , scanning confocal electron microscopy , computer science , physics , composite material , operating system
A novel technique of scanning tunneling microscopy applied to optical surfaces has been analyzed both in theory and experiment in this paper. The profiles of Al, Mo coated film surfaces and multilayer film steps are measured with the scanning tunneling microscope and stylus instrament, whose experimental results are compared and analyzed.