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The structural, optical, and morphological properties of NiO‐Cu prepared by spray pyrolysis technique
Author(s) -
Mohamad Haidar J.,
AbdulHusaain Yahyah Mustafa,
AlJarah Uday Ali Sabeeh
Publication year - 2020
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.32500
Subject(s) - non blocking i/o , materials science , thin film , crystallite , nickel oxide , electrical resistivity and conductivity , substrate (aquarium) , nickel , layer (electronics) , fabrication , doping , conductivity , analytical chemistry (journal) , chemical engineering , metallurgy , composite material , nanotechnology , optoelectronics , catalysis , chemistry , medicine , biochemistry , oceanography , alternative medicine , engineering , pathology , chromatography , geology , electrical engineering
Abstract The technique of spray pyrolysis used to prepare the pure thin films NiO and NiO:Cu. In this study, the nickel chloride salt solution (NiCl 2 ⋅6H 2 O) was used to fabricate thin films deposited on a glass substrate. The structural, optical, and morphological fabricated properties of the samples were investigated. X‐ray diffraction reveals a polycrystalline nickel oxide layer with a crystalline cubic form, with (111), (200), and (222). Atomic force microscopic studied the surface morphology of the thin‐film samples. The fabrication process of growth was at the specific doping ratio (0%, 0.5%, 1%, 1.5%, and 2%) where all thin films had a cubic structure. The energy difference for the NiO and NiO:Cu reference samples have ranged from 3.25 to 3.5 eV. The mobility, magnetoresistance, resistivity, and conductivity were measured and presented as well as the relationship between current‐voltage and current‐resistivity.