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Symmetry degradation of differential circuits induced by uneven gold plating of high‐speed connectors in extreme environment
Author(s) -
Wang Ziren,
Gao Jinchun,
Tian Puxuan,
Xie Gang
Publication year - 2020
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.32492
Subject(s) - electronic circuit , signal integrity , cable gland , electronic engineering , reflection symmetry , symmetry (geometry) , printed circuit board , materials science , engineering , electrical engineering , mathematics , geometry
High‐speed connectors are widely used in digital differential circuits. Because of the uneven gold plating, the thin gold plating area on the contact surface of the connector will form corrosion films in extreme environment, which may not only deteriorate the reflection and transmission performance of electromagnetic wave in differential circuits but also affects its symmetry, which results in poor communication quality. In this work, considering the influence of differential circuit symmetry on the signal transmission, reflection and crosstalk, the d parameter was defined for measuring the circuit symmetry. The impact of high‐speed connector degradation on symmetry of differential circuits was studied by both experimental investigation and electromagnetic numerical calculation model analysis. These results are helpful in developing a better understanding of impact of connector degradation on symmetry of high‐speed differential circuits and in identifying failure features in fault diagnosis.