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Modeling and analysis of contact failure in the time and frequency domains
Author(s) -
Li Qingya,
Gao Jinchun,
Zhou Yuqi
Publication year - 2020
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.32295
Subject(s) - frequency domain , network analyzer (electrical) , time domain , electrical impedance , electronic engineering , spectrum analyzer , frequency analysis , time–frequency analysis , frequency response , computer science , frequency dependence , engineering , electrical engineering , physics , algorithm , telecommunications , nuclear magnetic resonance , radar , computer vision
In this article, theoretical modeling and simulations are introduced to explore the contact failure characteristics for connectors both in time and frequency domains. The equivalent models are developed to describe the impedance performances of un‐degraded and degraded connectors with the time domain and frequency domain, respectively. The experiments using a Network Analyzer for time and frequency domains analyses are conducted to verify the proposed models. The measured results agree well with the simulation results in the time and frequency domains.