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Optical bandpass filter with adjustable reflection using a thin‐film thickness for surgical fluorescein image‐guided microscopy applications
Author(s) -
Yoon KiCheol,
Kim Kwang Gi
Publication year - 2019
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.31684
Subject(s) - materials science , optics , microscope , optical microscope , band pass filter , interference filter , optical filter , microscopy , wavelength , optoelectronics , interference (communication) , scanning electron microscope , computer science , physics , telecommunications , channel (broadcasting)
Abstract Interference noise rejection of an optical bandpass filter (BPF) with an adjustable thin‐film thickness using titanium oxide (T i3 O 5 ), silicon dioxide (S i O 2 ), and a glass substrate for high‐performance surgical fluorescein image‐guided microscopy applications is achieved, and the details are presented herein. In general, a conventional surgical microscope utilizes a beam splitter due to interference noise rejection. However, this microscope is limited by a low‐quality resolution and high attenuation of fluorescein images. The image resolution is typically inadequate for diagnosis and the interference noise could be directed to the surgical microscope when a filter is used. The wavelength of the laser which is used is 780‐785 nm and the transmission and reflection of the fabricated BPF used in this investigation are 95% and 5% in the wavelength range of 815‐872 nm and the optical density is within 1.0.