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Ultra‐thin dual‐band polarization‐insensitive conformal metamaterial absorber
Author(s) -
Sharma Sameer Kumar,
Ghosh Saptarshi,
Srivastava Kumar Vaibhav,
Shukla Anuj
Publication year - 2017
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.30285
Subject(s) - metamaterial absorber , metamaterial , materials science , optics , multi band device , conformal map , microwave , reflection coefficient , polarization (electrochemistry) , wavelength , optoelectronics , tunable metamaterials , physics , geometry , engineering , telecommunications , chemistry , mathematics , quantum mechanics , antenna (radio)
In this paper, an ultra‐thin dual‐band conformal metamaterial absorber has been presented for X and Ku‐band applications. The proposed metamaterial unit cell consists of cross‐spanner like structure in center with square patch at corners on the top of a metal‐backed substrate. The proposed absorber offers low profile with a thickness of λ o /126 and λ o /80 where λ o is free space wavelength at 9.5 GHz and 15 GHz respectively. The designed structure has a four‐fold symmetry which inherently makes it insensitive to polarization angle variations. It also offers wide angular stability with reflection coefficient better than −10 dB under oblique incidence for TE and TM polarized waves up to 60°. The proposed structure has been fabricated and tested to validate the simulation results. Prototype absorber has also been tested for curved surfaces and simulated results are in good correlation with measured results obtained from unstrained absorber surface. © 2016 Wiley Periodicals, Inc. Microwave Opt Technol Lett 59:348–353, 2017