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Erratum for: The effect of void on characteristics of LDMOS power amplifier
Author(s) -
Son MiHyun,
Bae Sooho,
Park Hyuncheol,
Kwon Hyuck M.
Publication year - 2016
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.30090
Subject(s) - regret , confusion , ldmos , amplifier , electrical engineering , microwave , electronic engineering , computer science , physics , statistics , telecommunications , engineering , mathematics , psychology , cmos , transistor , voltage , psychoanalysis
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