Premium
Tunable matching network for accurate impedance measurement of on‐chip and PCB millimeter‐wave antennas
Author(s) -
Sandoval Granados L. K.,
Murphy Arteaga R. S.
Publication year - 2016
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.30083
Subject(s) - extremely high frequency , microwave , printed circuit board , electronic engineering , antenna (radio) , impedance matching , electromagnetic simulation , wafer , engineering , matching (statistics) , chip , electrical engineering , scattering parameters , electrical impedance , port (circuit theory) , telecommunications , mathematics , statistics
A tunable matching network is proposed to match antenna to ground‐signal‐ground probes allowing antennas measurement without further analysis or additional test structures. Excellent correlation for proposed model is achieved when compared with numerical electromagnetic analysis tool and one port S‐parameters measurements for millimeter‐wave on‐wafer and printed circuit board (PCB) antennas. © 2016 Wiley Periodicals, Inc. Microwave Opt Technol Lett 58:2516–2518, 2016