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High sensitive microwave sensor based on symmetrical split ring resonator for material characterization
Author(s) -
Alahnomi Rammah A.,
Zakaria Z.,
Ruslan E.,
Mohd Bahar. Amyrul Azuan,
Ab Rashid S. R.
Publication year - 2016
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.29979
Subject(s) - microwave , resonator , permittivity , planar , split ring resonator , materials science , characterization (materials science) , dielectric , sensitivity (control systems) , ring (chemistry) , resonance (particle physics) , measure (data warehouse) , optoelectronics , electronic engineering , microwave cavity , acoustics , engineering , physics , computer science , nanotechnology , telecommunications , chemistry , computer graphics (images) , organic chemistry , particle physics , database
A simple novel microwave planar sensor based on symmetrical split ring resonator (SSRR) has been applied for the first time to measure the dielectric permittivity of materials under test (MUT). The results achieve narrow resonance with high Q sensitivity of 407 which makes it great promising applications for biosensors in the future. Three practical materials have been used as standards to validate the sensor. A detailed sample thickness analysis has been considered and accordingly the mathematical equation is driven to extract the properties of materials. Experimentally, the measured and theoretical results are found in an excellent agreement with a 2–3% possibility of typical error in the permittivity measurement. © 2016 Wiley Periodicals, Inc. Microwave Opt Technol Lett 58:2106–2110, 2016