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Influence of structure parameters on FWHM and wavelength separation based on intensity‐tunable guided mode resonance filter
Author(s) -
Wang Qi,
Li Ye,
Huang Tian,
Wang Jianyu,
Zhang Dawei
Publication year - 2016
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.29654
Subject(s) - full width at half maximum , wavelength , azimuth , resonance (particle physics) , optics , materials science , guided mode resonance , microwave , intensity (physics) , bandwidth (computing) , filter (signal processing) , reflectivity , optical filter , optoelectronics , physics , atomic physics , telecommunications , quantum mechanics , diffraction grating , computer science , computer vision
With the proposed intensity‐tunable reflectance filter based on the effect of the guided mode resonance, the influence of the structure parameters on full width at half maximum (FWHM) and wavelength separation (Δ λ ) are studied. The experimental data indicates that the intensity of the spectral reflectance can be tuned by adjusting the azimuthal angle at the wavelength of 752.9 nm and 782.5 nm. With numerically calculated, the influence of the structural parameters on the value of wavelength separation between the dual resonance channels are analyzed. We investigated Δ λ and bandwidth by changing the parameters of the structure with the azimuthal angle of 45°. © 2016 Wiley Periodicals, Inc. Microwave Opt Technol Lett 58:705–708, 2016