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Accurate IC current extraction method and power distribution network optimization
Author(s) -
Lim Sangho,
Lee Sangho,
Ko Cheaok,
Shim Jongwan,
Cheon Jeongnam
Publication year - 2015
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.29301
Subject(s) - decoupling capacitor , oscilloscope , electronic engineering , voltage , electrical engineering , waveform , decoupling (probability) , capacitor , noise (video) , engineering , computer science , control engineering , artificial intelligence , image (mathematics)
Obtaining correct integrated circuit (IC) current information is a key factor for power distribution network design. This letter suggests an exact IC current extraction method using a measured voltage of a board when detailed IC data cannot be accessible. Voltage waveform is measured at the closest decoupling capacitor position from an IC after the capacitor is eliminated. Using the measured voltage and new transfer function which eliminates oscilloscope probe noise effect, we are able to calculate an exact IC current. The proposed methodology is validated by comparing the simulated noise voltage with the real measured noise voltage of 1.2 V core circuit. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:2175–2182, 2015