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Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry
Author(s) -
Moungache A.,
Bayard B.,
Tahir Abakar Mahamat,
Robert S.,
Jamon D.,
Gambou F.
Publication year - 2015
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.28998
Subject(s) - ellipsometry , refractive index , optics , microwave , materials science , isotropy , refraction , dielectric , polarization (electrochemistry) , optoelectronics , physics , chemistry , thin film , quantum mechanics , nanotechnology
This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a nondestructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1006–1013, 2015