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Characterization and time domain analysis of coaxial connector junctions
Author(s) -
Zhu Qian C.,
Ji Yu
Publication year - 2014
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.28609
Subject(s) - cable gland , coaxial , time domain , network analyzer (electrical) , embedding , calibration , characterization (materials science) , microwave , finite difference time domain method , electronic engineering , domain (mathematical analysis) , scattering parameters , coaxial cable , engineering , electrical engineering , materials science , computer science , physics , optics , telecommunications , mathematics , mathematical analysis , artificial intelligence , quantum mechanics , computer vision
We propose a simple circuit model for coaxial connector junctions and apply time domain analysis to examine various connector defects. Close approximations to the measured time domain response for calibration standards provide a possibility for error model embedding in vector network analyzer measurements. © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:2439–2444, 2014