Design and development of an equilateral patch sensor for determination of permittivity of homogeneous dielectric medium | Zendy

Biswas Manotosh | Zendy; Mandal Anirban | Zendy

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Design and development of an equilateral patch sensor for determination of permittivity of homogeneous dielectric medium

Author(s) -

Biswas Manotosh,

Mandal Anirban

Publication year - 2014

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.28269

Subject(s) - equilateral triangle , homogeneous , permittivity , dielectric , microwave , materials science , electronic engineering , dielectric permittivity , acoustics , optoelectronics , computer science , engineering , physics , geometry , telecommunications , mathematics , thermodynamics

A simple and fast computer aided design oriented cavity model and single resonant parallel R‐L‐C circuit are proposed to design an inverted equilateral patch used as a sensor to predict the permittivity of homogeneous dielectric medium. The numerical results obtained with the present model are validated with measured results. We have also used electromagnetic softwares to validate this structure. This structure will be very useful for optimal integration of external components (active or passive devices). © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:1097–1104, 2014

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