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Highly sensitive refractive index measurement based an a thinned fiber taper
Author(s) -
Du Chengliang,
Yang Xianhui
Publication year - 2014
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.28252
Subject(s) - materials science , refractive index , optics , sensitivity (control systems) , fiber , microwave , optoelectronics , composite material , electronic engineering , telecommunications , engineering , physics
A thinned fiber taper (TFT) with high refractive index (RI) sensitivity has been fabricated by a fusion splicer. The TFT has a total length of about 1.3 mm and a waist diameter of less than 10 μm. Simulations of the TFT have been implemented and the RI experiments show a remarkable sensitivity. The highest RI sensitivities of 6360 nm/RI unit (RIU) and 3850 nm/RIU in the RI ranges of 1.409–1.423 and 1.333–1.353, respectively, have been obtained on two TFTs with different taper waist diameters. The RI dynamic ranges of the TFTs also have been discussed. © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:1054–1057, 2014