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Complex permittivity and permeability estimation by reflection measurements of open and short coaxial transmission line
Author(s) -
Staszek Kamil,
Gruszczynski Slawomir,
Wincza Krzysztof
Publication year - 2014
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.28132
Subject(s) - permittivity , transmission line , reflection coefficient , dielectric , offset (computer science) , scattering parameters , reflection (computer programming) , microwave , materials science , optics , transmission coefficient , measurement uncertainty , coaxial , permeability (electromagnetism) , electronic engineering , transmission (telecommunications) , physics , computer science , engineering , optoelectronics , mathematics , electrical engineering , chemistry , telecommunications , statistics , biochemistry , membrane , programming language
A novel method for complex permittivity and permeability measurements of dielectrics has been shown. The method is based on a previously developed transmission‐line technique, however, has been modified to allow for dielectric properties estimation with measurements of reflections only. The analysis of measurement errors, resulting from: sample length uncertainty, vector network analyzer uncertainty, and open‐end inaccuracy, has been shown in the article. The calibration method using open/short/offset‐short standards has been described. The method has been experimentally tested by measurements of three different reference liquid samples. A good agreement between measured values and previously published ones has been obtained. © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:727–732, 2014
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