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High reference impedance reflectometer for nonresonant matching of near‐field microwave microscope tip probe
Author(s) -
Glay David,
Fellahi Abdelhatif El,
Lasri Tuami
Publication year - 2014
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.28018
Subject(s) - microwave , impedance matching , electrical impedance , optics , microscope , materials science , microwave imaging , optical time domain reflectometer , acoustics , optoelectronics , physics , electrical engineering , engineering , optical fiber , fiber optic sensor , quantum mechanics , graded index fiber
In this letter, we present a nonresonant high impedance reflectometer integrating a tip probe dedicated to near‐field microwave microscopy. A 1‐kohms reflectometer is fabricated by using lumped elements to validate the approach proposed to solve the problem of impedance mismatch between the probe and the measurement system. © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:64–69, 2014
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