Premium
A Comparative Study of Two Numerical Techniques To Analyze Double Screen Frequency Selective Surface
Author(s) -
Silva Tercio L.,
Campos Antonio L. P. S.,
d'Assunção Adaildo G.,
Maniçoba Robson H. C.
Publication year - 2013
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.27782
Subject(s) - selective surface , tunable metamaterials , microwave , scattering , surface (topology) , matrix (chemical analysis) , set (abstract data type) , frequency domain , physics , optics , computer science , electronic engineering , engineering , mathematics , materials science , metamaterial , telecommunications , mathematical analysis , geometry , composite material , programming language
A comparative study of two techniques to analyze double screen frequency selective surface (FSS) is presented. The FSS are composed with perfectly conducting rectangular patch elements. Numerical and experimental results are presented. The two techniques are the scattering matrix (SM) and the spectral domain analysis. The study allowed us to set up main advantages and constraints of these techniques and define which one should be used for particular FSS geometries and conditions. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:2206–2209, 2013