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Double diffraction and double reflection in NURBS‐UTD method
Author(s) -
Wang Nan,
Du XinXin,
Wang Yong,
Liang ChangHong
Publication year - 2013
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.27652
Subject(s) - diffraction , reflection (computer programming) , optics , microwave , field (mathematics) , ray tracing (physics) , uniform theory of diffraction , physics , computational physics , computer science , mathematics , telecommunications , pure mathematics , programming language
Double diffraction and double reflection in NURBS‐UTD method are studied in this article. Algorithms being used to trace double reflected rays and double edge diffracted rays are presented. The ray fields carried by these kinds of rays are investigated to discuss the contribution of the double effected ray fields to the total ray fields. Numerical measures are used throughout the whole process and the ray fields are calculated based on single effected ray fields. Two examples are presented and it can be seen from data achieved that double effected ray fields can improve the computational precision according to the relationship between surfaces. Numerical results show the validation and the improvement. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:1549–1553, 2013; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27652