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Experiment of substrate integrated waveguide interconnect measurement for high speed data transmission application
Author(s) -
Li Zhaolong,
Mahani Mohammad S.,
Abhari Ramesh
Publication year - 2012
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.26521
Subject(s) - interconnection , microwave , waveguide , data transmission , electronic engineering , substrate (aquarium) , transmission (telecommunications) , engineering , computer science , electrical engineering , materials science , optoelectronics , telecommunications , oceanography , geology
Substrate integrated waveguide (SIW) has been used as a high speed interconnect for digital applications. The output eye diagram is an important indicator for evaluating the performance of the interconnect and the design of the driver and receiver units. This article studies the effect on eye diagrams based on improved driver and receiver design for a SIW interconnect system. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett, 2012