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Characterization of material anisotropy using microwave ellipsometry
Author(s) -
Gambou F.,
Bayard B.,
Noyel G.
Publication year - 2011
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.26201
Subject(s) - microwave , anisotropy , ellipsometry , characterization (materials science) , materials science , polarization (electrochemistry) , optics , microwave transmission , optoelectronics , physics , engineering , telecommunications , nanotechnology , chemistry , thin film
Abstract The aim of this article is to propose an original low‐cost new experimental technique for the characterization of anisotropic media.This technique is based on free‐space transmission ellipsometry at microwave frequency (30 GHz). This method allows to obtain the electromagnetic anisotropy in a material through the measurement of microwave polarization states. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26201