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Quadrature phase‐shifted white‐light interferometry for the measurement of short‐cavity extrinsic fabry–perot interferometric sensors
Author(s) -
Wang Gao
Publication year - 2011
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.25920
Subject(s) - fabry–pérot interferometer , interferometry , white light interferometry , optics , quadrature (astronomy) , white light , phase (matter) , materials science , physics , laser , quantum mechanics
Abstract A quadrature phase‐shifted white‐light interferometry is demonstrated to interrogate short‐cavity extrinsic Fabry–Perot interferometric (EFPI) sensors. The absolute cavity length of an EFPI can be recovered by constructing two quadrature signals using the white‐light spectrum of the EFPI. Experimental results show that the measurement resolution can be improved, and a linear output is obtained when interrogating an EFPI temperature sensor. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:1011–1015, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25920