Continuous‐wave scanning terahertz near‐field microscope | Zendy

Guillet J.P. | Zendy; Chusseau L. | Zendy; Adam R. | Zendy; Grosjean T. | Zendy; Penarier A. | Zendy; Baida F. | Zendy; Charraut D. | Zendy

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Continuous‐wave scanning terahertz near‐field microscope

Author(s) -

Guillet J.P.,

Chusseau L.,

Adam R.,

Grosjean T.,

Penarier A.,

Baida F.,

Charraut D.

Publication year - 2011

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.25754

Subject(s) - terahertz radiation , optics , reflectometry , microwave , decoupling (probability) , materials science , microscope , detector , near and far field , microwave imaging , coupling (piping) , differential phase , optoelectronics , physics , phase (matter) , engineering , time domain , computer science , metallurgy , computer vision , quantum mechanics , control engineering

A versatile cw measurement setup for terahertz near‐field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:580–582, 2011; View this article at wileyonlinelibrary.com. DOI 10.1002/mop.25754

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