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Continuous‐wave scanning terahertz near‐field microscope
Author(s) -
Guillet J.P.,
Chusseau L.,
Adam R.,
Grosjean T.,
Penarier A.,
Baida F.,
Charraut D.
Publication year - 2011
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.25754
Subject(s) - terahertz radiation , optics , reflectometry , microwave , decoupling (probability) , materials science , microscope , detector , near and far field , microwave imaging , coupling (piping) , differential phase , optoelectronics , physics , phase (matter) , engineering , time domain , computer science , metallurgy , computer vision , quantum mechanics , control engineering
A versatile cw measurement setup for terahertz near‐field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:580–582, 2011; View this article at wileyonlinelibrary.com. DOI 10.1002/mop.25754