Premium
Noise‐parameter measurements with a reflection type phase shifter
Author(s) -
Gu Dazhen,
Walter David K.,
Randa James
Publication year - 2010
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.25532
Subject(s) - repeatability , phase shift module , noise (video) , amplifier , nist , microwave , phase noise , electronic engineering , y factor , noise temperature , reflection (computer programming) , electrical engineering , noise figure , materials science , acoustics , engineering , physics , computer science , mathematics , cmos , telecommunications , statistics , artificial intelligence , natural language processing , image (mathematics) , programming language
We report a miniaturized phase shifter operating in the frequency range from 5 to 7 GHz for noise‐parameter extraction. Such a tunable solid‐state unit represents a significant reduction in the size and mass as a source‐pull component, compared to its mechanical counterparts. It provides adequate impedance coverage, ultra‐fast response, as well as high repeatability, across the designed region. A packaged low‐noise amplifier was measured at integer frequencies by use of the phase shifter on the NIST NFRad system. The measured results exhibited good accuracy. The combined uncertainties (Type‐A and Type‐B) are below 6% for both the minimum noise temperature and the magnitude of the optimum input reflection coefficient. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52:2600–2603, 2010; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25532