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Design of experiments as a microwave CAD tool
Author(s) -
Naishadham Krishna
Publication year - 2010
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.25133
Subject(s) - microwave , electronic engineering , design of experiments , electronic circuit , circuit design , cad , engineering , monolithic microwave integrated circuit , computer aided design , computer science , electrical engineering , engineering drawing , telecommunications , mechanical engineering , mathematics , amplifier , statistics , cmos
With the increase in geometrical and physical complexity of microwave circuits, statistical techniques to reduce the design cycles continue to grow in importance.The objective of this article is to review the theory of a statistical design tool called the design of experiments (DOE) and discuss its utility in developing Computer‐aided design models for microwave circuits. A circuit example of DOE application, pertaining to identification of dominant sources of variation in the return loss of a coplanar waveguide flip‐chip interconnect package, is reviewed. An empirical design formula is developed for the return loss based on regression analysis, which demonstrates that interaction between factors cannot be neglected, as is the norm in trialanderror analysis using one factor at a time. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52: 1020–1024, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25133