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Dual‐band and enhanced band FSS characterization using WCIP method
Author(s) -
Titaouine M.,
Raveu N.,
Gomes Neto A.,
Baudrand H.
Publication year - 2010
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.25073
Subject(s) - hfss , multi band device , microwave , bandwidth (computing) , strips , tunable metamaterials , materials science , multi band , optics , optoelectronics , electronic engineering , engineering , physics , electrical engineering , telecommunications , metamaterial , microstrip antenna , antenna (radio) , composite material
Wave concept iterative procedure (WCIP) is used to analyze dual‐band and enhanced band frequency selective surfaces (FSS). In the metallic U‐shaped simple FSS, a fine‐tune of the two rejected bands is insured by varying independently the length of the two parallel U‐shaped FSS strips. The dual band response can also be obtained from the two‐level rectangular conducting patches FSS. An enhanced rejecting bandwidth is observed for FSS with two square ring printed on each substrate side. The WCIP results are successfully compared with measurements and HFSS results. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52:836–839, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25073