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Simultaneous complex permittivity and thickness evaluation of liquid materials from scattering parameter measurements
Author(s) -
Hasar U. C.,
Cansiz A.
Publication year - 2010
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24837
Subject(s) - permittivity , microwave , scattering parameters , materials science , distilled water , scattering , waveguide , dielectric permittivity , relative permittivity , electronic engineering , optics , optoelectronics , dielectric , computer science , engineering , chemistry , physics , chromatography , telecommunications
A promising in‐waveguide microwave method has been proposed for unique complex permittivity determination of liquid materials pressed by two plugs. The method involves the effects of plugs with different electrical properties and/or lengths on measurements. In addition, it measures the length of liquid samples which sometimes are difficult to evaluate in‐waveguide measurements. We have validated the proposed method with complex permittivity and length measurements of distilled water. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52: 75–78, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24837