Premium
Characteristics estimation for high‐impedance surfaces based ultrathin radar absorber
Author(s) -
Li YouQuan,
Fu YunQin,
Yuan NaiChang
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24453
Subject(s) - resistor , microwave , radar , electrical impedance , capacitance , reflection (computer programming) , electronic engineering , acoustics , engineering , frequency band , range (aeronautics) , electrical engineering , materials science , physics , computer science , telecommunications , antenna (radio) , aerospace engineering , electrode , quantum mechanics , voltage , programming language
In this article, an ultrathin Radar Absorbing Material (RAM) based on high‐impedance surfaces (HIS) has been investigated. Simple analytical formulas for the input impedance of HIS RAM are present and the equivalent model of lumped resistor is given to achieve better absorbing performance. From the simulated results, it is seen that the absorbing band of HIS RAM is decided by the reflection phase of HIS in the range ±60°, the measured absorbing frequency band moved toward lower‐frequency than the simulated results, which attribute to the parasitic capacitance introduced by lumped resistors. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1775–1778, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24453