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Elimination of the dependency of the calibration plane and the sample thickness from complex permittivity measurements of thin materials
Author(s) -
Hasar U. C.,
Inan O. E.
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24445
Subject(s) - calibration , permittivity , sample (material) , materials science , scattering parameters , microwave , relative permittivity , dependency (uml) , optics , measure (data warehouse) , plane (geometry) , broadband , scattering , optoelectronics , computer science , physics , dielectric , telecommunications , mathematics , geometry , quantum mechanics , database , thermodynamics , software engineering
In nonresonant broadband measurements, thin samples do not fill the entire sample holder (a waveguide or coaxial‐line section). In this circumstance, the measured scattering parameters have to be transformed from the calibration plane to the sample end surfaces. Furthermore, it is always attractive to measure the complex permittivity of materials with no prior information of their thickness. This article proposes a simple but powerful method to eliminate the dependency of both the calibration plane and the sample thickness on permittivity measurements of thin nondispersive materials. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1642–1646, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24445