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A position‐invariant calibration‐independent method for permittivity measurements
Author(s) -
Hasar U. C.,
Inan O. E.
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24364
Subject(s) - permittivity , scattering parameters , microwave , calibration , relative permittivity , singularity , materials science , computational physics , dielectric , optics , mathematical analysis , mathematics , physics , optoelectronics , computer science , telecommunications , statistics
A simple yet powerful calibration‐independent method is proposed for complex permittivity extraction of dielectric materials. There are two main features of the method as follows: (a) it decreases any uncertainty arising from using a second (extra) sample and (b) it does not require precise location of the sample within its cell (a waveguide or coaxial‐line section). The disadvantage of the method is that it may produce some singularity points while extracting the complex permittivity from measurements. We validated the method by calibrated and uncalibrated complex scattering parameter measurements of a polyvinyl‐chloride (PVC) sample at X‐band (8.2–12.4 GHz). © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1406–1408, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24364