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Sensitivity analysis of the effective parameter extraction procedure for metamaterial applications
Author(s) -
Tyagi Varun,
Semouchkina Elena
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24267
Subject(s) - metamaterial , permittivity , microwave , sensitivity (control systems) , reflection coefficient , reflection (computer programming) , extraction (chemistry) , refractive index , scattering parameters , materials science , transmission coefficient , transmission (telecommunications) , optics , electronic engineering , computer science , optoelectronics , physics , engineering , telecommunications , dielectric , chemistry , chromatography , programming language
We examine the accuracy of metamaterial effective parameters extraction from the reflection and transmission data and show that this procedure could lead to significant errors in the effective permittivity and permeability values near frequencies where the reflection coefficient has low magnitudes, while the refractive index can still be accurately extracted. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1013–1017, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24267