Effect of nonlinear wavelength scanning to Fourier transform white‐light interferometry | Zendy

Jiang Yi | Zendy; Tang Caijie | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Effect of nonlinear wavelength scanning to Fourier transform white‐light interferometry

Author(s) -

Jiang Yi,

Tang Caijie

Publication year - 2009

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.24097

Subject(s) - interferometry , optics , white light interferometry , fourier transform , microwave , optical path length , wavelength , mach–zehnder interferometer , nonlinear system , filter (signal processing) , materials science , fourier transform spectroscopy , physics , fourier transform infrared spectroscopy , engineering , electrical engineering , quantum mechanics

The effect of nonlinear wavelength scanning to Fourier transform white‐light interferometry was examined. A Mach‐Zehnder interferometer was interrogated, and the absolute optical path difference was measured. The experimental results show that the nonlinearity of the Fabry‐Perot tunable filter has no effect on the measurement. A measuring discrimination of 3 nm is achieved. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 426–432, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24097

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research