Premium
Effect of nonlinear wavelength scanning to Fourier transform white‐light interferometry
Author(s) -
Jiang Yi,
Tang Caijie
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24097
Subject(s) - interferometry , optics , white light interferometry , fourier transform , microwave , optical path length , wavelength , mach–zehnder interferometer , nonlinear system , filter (signal processing) , materials science , fourier transform spectroscopy , physics , fourier transform infrared spectroscopy , engineering , electrical engineering , quantum mechanics
The effect of nonlinear wavelength scanning to Fourier transform white‐light interferometry was examined. A Mach‐Zehnder interferometer was interrogated, and the absolute optical path difference was measured. The experimental results show that the nonlinearity of the Fabry‐Perot tunable filter has no effect on the measurement. A measuring discrimination of 3 nm is achieved. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 426–432, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24097