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Compact 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas
Author(s) -
Ranvier Sylvain,
Kyrö Mikko,
Icheln Clemens,
Luxey Cyril,
Staraj Robert,
Vainikainen Pertti
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.24034
Subject(s) - microwave , wafer , omnidirectional antenna , antenna (radio) , radiation pattern , radiation , slot antenna , electrical engineering , optoelectronics , engineering , optics , electronic engineering , materials science , physics , telecommunications
This article presents a quasi full 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas. The measurement of an omnidirectional antenna is reported and shows promising results. The radiation of the probe itself as well as the effects of a connector feeding the antenna are also studied. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 319–324, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24034