A self‐checking technique for materials characterization using calibration‐independent measurements of reflecting lines | Zendy

Hasar U. C. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

A self‐checking technique for materials characterization using calibration‐independent measurements of reflecting lines

Author(s) -

Hasar U. C.

Publication year - 2009

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.23978

Subject(s) - calibration , permittivity , scattering parameters , microwave , characterization (materials science) , metric (unit) , dielectric , materials science , function (biology) , scattering , signal (programming language) , electronic engineering , optics , computer science , algorithm , optoelectronics , engineering , physics , telecommunications , operations management , quantum mechanics , evolutionary biology , biology , programming language

There is a need for a method for the performance evaluation of calibration‐independent measurements of dielectric materials located into a measurement cell (a coaxial or waveguide section) before starting the extraction of the complex permittivity of the sample. This is important since such a method can signal the accurateness of measurements and even may show any problem of numerical methods used for the permittivity extraction. In this article, we present a metric function derived for reflecting cells, in which the samples partially or completely fill. The function is validated by uncalibrated scattering parameter measurements. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 129–132, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23978

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research