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A self‐checking technique for materials characterization using calibration‐independent measurements of reflecting lines
Author(s) -
Hasar U. C.
Publication year - 2009
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.23978
Subject(s) - calibration , permittivity , scattering parameters , microwave , characterization (materials science) , metric (unit) , dielectric , materials science , function (biology) , scattering , signal (programming language) , electronic engineering , optics , computer science , algorithm , optoelectronics , engineering , physics , telecommunications , operations management , quantum mechanics , evolutionary biology , biology , programming language
There is a need for a method for the performance evaluation of calibration‐independent measurements of dielectric materials located into a measurement cell (a coaxial or waveguide section) before starting the extraction of the complex permittivity of the sample. This is important since such a method can signal the accurateness of measurements and even may show any problem of numerical methods used for the permittivity extraction. In this article, we present a metric function derived for reflecting cells, in which the samples partially or completely fill. The function is validated by uncalibrated scattering parameter measurements. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 129–132, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23978