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Evaluation of coplanar waveguide‐to‐microstrip transitions for precision S ‐parameter measurements
Author(s) -
O'Neil Benton K.,
Young Jeffery L.
Publication year - 2008
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.23755
Subject(s) - coplanar waveguide , microstrip , microwave , metric (unit) , a priori and a posteriori , electronic engineering , power (physics) , engineering , network topology , electrical engineering , enhanced data rates for gsm evolution , electronic circuit , line (geometry) , waveguide , topology (electrical circuits) , computer science , physics , telecommunications , optics , mathematics , philosophy , operations management , epistemology , quantum mechanics , operating system , geometry
The metric of unaccounted power is introduced as a sufficient condition to successful thru‐reflect‐line (TRL) calibrations for microstrip circuits. It is then demonstrated how this metric can be used both a priori, with simulation data, and a posteriori, with measured data, to evaluate the efficacy of coplanar waveguide to microstrip transitions in TRL calibrations. This demonstration is performed with four different transition topologies, two of which utilize coaxial edge mount connectors and two of which utilize ground‐signal‐ground coplanar probes. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 2667–2671, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23755