High dielectric constant tape double‐stacked EBG structure for broadband suppression of SSN in LTCC‐based SiP applications | Zendy

Park Jongbae | Zendy; Lu Albert Chee W. | Zendy; Sunappan Vasudivan | Zendy; Wai Lai L. | Zendy; Kim Joungho | Zendy

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High dielectric constant tape double‐stacked EBG structure for broadband suppression of SSN in LTCC‐based SiP applications

Author(s) -

Park Jongbae,

Lu Albert Chee W.,

Sunappan Vasudivan,

Wai Lai L.,

Kim Joungho

Publication year - 2008

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.23253

Subject(s) - broadband , materials science , dielectric , microwave , optoelectronics , bandwidth (computing) , ceramic , substrate (aquarium) , band gap , electrical engineering , electronic engineering , engineering , telecommunications , composite material , oceanography , geology

The advantages of a dielectric loaded double‐stacked electromagnetic bandgap structure with a significantly improved noise isolation bandwidth, fabricated on a low‐temperature co‐fired ceramic multilayer substrate, were experimentally demonstrated in system‐in‐package applications. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 942–944, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23253

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