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High dielectric constant tape double‐stacked EBG structure for broadband suppression of SSN in LTCC‐based SiP applications
Author(s) -
Park Jongbae,
Lu Albert Chee W.,
Sunappan Vasudivan,
Wai Lai L.,
Kim Joungho
Publication year - 2008
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.23253
Subject(s) - broadband , materials science , dielectric , microwave , optoelectronics , bandwidth (computing) , ceramic , substrate (aquarium) , band gap , electrical engineering , electronic engineering , engineering , telecommunications , composite material , oceanography , geology
The advantages of a dielectric loaded double‐stacked electromagnetic bandgap structure with a significantly improved noise isolation bandwidth, fabricated on a low‐temperature co‐fired ceramic multilayer substrate, were experimentally demonstrated in system‐in‐package applications. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 942–944, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23253