The application of the second‐order accurate FDTD techniques at planar dielectric interface in three‐dimensional case | Zendy

Ding Hai | Zendy; Chu QingXin | Zendy

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The application of the second‐order accurate FDTD techniques at planar dielectric interface in three‐dimensional case

Author(s) -

Ding Hai,

Chu QingXin

Publication year - 2008

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.23245

Subject(s) - finite difference time domain method , planar , microwave , dielectric , polarization (electrochemistry) , interface (matter) , order (exchange) , computer science , optics , computational physics , materials science , electronic engineering , mathematics , mathematical analysis , physics , engineering , optoelectronics , chemistry , telecommunications , quantum mechanics , computer graphics (images) , surface tension , gibbs isotherm , finance , economics

The second‐order accurate FDTD equations at planar dielectric interfaces in three‐dimensional case are straightforwardly presented based on the second‐order accurate FDTD techniques in the TE x and TM x polarization modes proposed previously. Numerical experiments are carried out to verify the better accuracy of the method in this article than the conventional FDTD equations. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 871–875, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23245

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