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The application of the second‐order accurate FDTD techniques at planar dielectric interface in three‐dimensional case
Author(s) -
Ding Hai,
Chu QingXin
Publication year - 2008
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.23245
Subject(s) - finite difference time domain method , planar , microwave , dielectric , polarization (electrochemistry) , interface (matter) , order (exchange) , computer science , optics , computational physics , materials science , electronic engineering , mathematics , mathematical analysis , physics , engineering , optoelectronics , chemistry , telecommunications , quantum mechanics , computer graphics (images) , surface tension , gibbs isotherm , finance , economics
The second‐order accurate FDTD equations at planar dielectric interfaces in three‐dimensional case are straightforwardly presented based on the second‐order accurate FDTD techniques in the TE x and TM x polarization modes proposed previously. Numerical experiments are carried out to verify the better accuracy of the method in this article than the conventional FDTD equations. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 871–875, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23245