Premium
Characteristic impedance of a novel TEM cell used for microwave chemistry experiment
Author(s) -
Yang Yang,
Huang Kama
Publication year - 2008
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.23135
Subject(s) - microwave , cutoff frequency , conformal map , electromagnetic field , electrical impedance , cutoff , electromagnetic radiation , transverse mode , materials science , wave impedance , transverse plane , characteristic impedance , computational physics , physics , optics , optoelectronics , engineering , electrical engineering , mathematics , mathematical analysis , quantum mechanics , laser , structural engineering
New experimental devices with uniform electromagnetic field distribution are needed in the kinetic studies of microwave chemistry. Here a novel transverse electromagnetic (TEM) cell is proposed. The shape of the TEM cell is different from the conventional TEM cells, and it has a higher cutoff frequency of the first TE‐mode than the conventional one with the same outer dimension and a larger area of uniform electromagnetic fields than the conventional one with the same cutoff frequency. The conformal mapping method was used to calculate the characteristic impedance of the TEM cell. The finite element method was used to confirm the analytical solutions. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 525–529, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23135