Premium
Millimeter wave inspection of concealed objects
Author(s) -
Jaeger Irina,
Zhang Lixiao,
Stiens Johan,
Sahli Hichem,
Vounckx Roger
Publication year - 2007
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.22870
Subject(s) - speckle pattern , extremely high frequency , visibility , computer science , optics , microwave , engineering , computer graphics (images) , computer vision , artificial intelligence , telecommunications , physics
Imaging concealed objects with a millimeter‐wave coherent beam is accompanied with speckle. Two tools were chosen to improve visibility of concealed objects for security or industrial inspection: a speckle contrast image (image processing tool) and a Hadamard diffuser (mechanical tool). We report more then 50% speckle reduction over the full W‐band. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 2733–2737, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22870