Millimeter wave inspection of concealed objects | Zendy

Jaeger Irina | Zendy; Zhang Lixiao | Zendy; Stiens Johan | Zendy; Sahli Hichem | Zendy; Vounckx Roger | Zendy

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Millimeter wave inspection of concealed objects

Author(s) -

Jaeger Irina,

Zhang Lixiao,

Stiens Johan,

Sahli Hichem,

Vounckx Roger

Publication year - 2007

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.22870

Subject(s) - speckle pattern , extremely high frequency , visibility , computer science , optics , microwave , engineering , computer graphics (images) , computer vision , artificial intelligence , telecommunications , physics

Imaging concealed objects with a millimeter‐wave coherent beam is accompanied with speckle. Two tools were chosen to improve visibility of concealed objects for security or industrial inspection: a speckle contrast image (image processing tool) and a Hadamard diffuser (mechanical tool). We report more then 50% speckle reduction over the full W‐band. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 2733–2737, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22870

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