z-logo
Premium
Self and mutual admittance of CPW‐FED slots on conductor‐backed two‐layer substrate
Author(s) -
Jacobs J. P.
Publication year - 2007
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.22866
Subject(s) - admittance , conductor , microwave , characterization (materials science) , substrate (aquarium) , layer (electronics) , electronic engineering , electrical engineering , optoelectronics , materials science , engineering , electrical impedance , telecommunications , composite material , nanotechnology , oceanography , geology
A characterization of the mutual admittance between CPW‐fed slot antennas on a practically feasible conductor‐backed two‐layer substrate is provided in conjunction with a characterization of isolated slot resonant self‐properties. This data is of interest for linear array design purposes. Numerical results are validated by a measurement. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 2798–2802, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22866

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom