Premium
A CPW linear resonator method for the microwave characterization of high dielectric constant films
Author(s) -
Demenicis Luciene S.,
Lima Rodolfo A. A.,
Conrado Luiz Fernando M.,
Margulis Walter,
Carvalho Maria Cristina R.
Publication year - 2007
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.22176
Subject(s) - microwave , resonator , dielectric , materials science , coplanar waveguide , high κ dielectric , dielectric resonator , ceramic , optoelectronics , permittivity , substrate (aquarium) , photolithography , characterization (materials science) , electronic engineering , dielectric resonator antenna , composite material , nanotechnology , telecommunications , engineering , oceanography , geology
A coplanar waveguide linear resonator technique for the experimental characterization of the dielectric properties of films in the microwave frequency range at room temperature is proposed. The approach is simple to implement as it consists of a film with unknown high dielectric constant deposited over the resonator, printed on standard alumina substrate using conventional photolithography process. The technique is illustrated by the measurement of the dielectric constant and losses of various ceramic screen‐printed thick films: BaTiO 3 (BTO), CaCu 3 Ti 4 O 12 (CCTO), and a BTO( x )–CCTO(1 − x ) composite with different concentrations ( x = 0.2, 0.5, and 0.8). © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 521–524, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22176